Learning from Data - 2025 entry
| MODULE TITLE | Learning from Data | CREDIT VALUE | 15 |
|---|---|---|---|
| MODULE CODE | ECMM445 | MODULE CONVENER | Dr Diogo Pacheco (Coordinator), Dr Chico Camargo |
| DURATION: TERM | 1 | 2 | 3 |
|---|---|---|---|
| DURATION: WEEKS | 11 | 0 | 0 |
| Number of Students Taking Module (anticipated) | 30 |
|---|
DESCRIPTION - summary of the module content
Artificially intelligent machines and software must assimilate data from their environment and make decisions based upon it. Likewise, we live in a data-rich society and must be able to make sense of complex datasets. This module will introduce you to machine learning methods for learning from data. You will learn about the principal learning paradigms from a theoretical point of view and gain practical experience through a series of workshops. Throughout the module, there will be an emphasis on dealing with real data, and you will use, modify and write software to implement learning algorithms. It is often useful to be able to visualise data and you will gain experience of methods of reducing the dimension of large datasets to facilitate visualisation and understanding.
The module will also cover some recent neural network architectures and related learning algorithms.
AIMS - intentions of the module
This module aims to equip you with the fundamentals of machine learning and at the same time discuss technical aspects of some well-known machine learning models and related learning algorithms. It will provide a thorough grounding in the theory and application of machine learning and statistical techniques for classification, regression and unsupervised methods (clustering and dimension reduction). The module will cover kernel methods and neural networks (feed-forward architectures only).
INTENDED LEARNING OUTCOMES (ILOs) (see assessment section below for how ILOs will be assessed)
On successful completion of this module you should be able to:
Module Specific Skills and Knowledge
1. Apply principles for statistical and neural pattern recognition to novel data.
2. Analyse novel pattern recognition and classification problems, establish models for them and write software to solve them.
Discipline Specific Skills and Knowledge
3. Utilise a range of supervised and unsupervised pattern recognition and machine learning techniques to solve a wide range of problems.
4. State the importance and difficulty of establishing principled models for pattern recognition.
Personal and Key Transferable / Employment Skills and Knowledge
5. Use Python or other programming languages for scientific analysis and simulation.
6. Identify the compromises and trade-offs that must be made when translating theory into practice.
7. Critically read and report on research papers.
SYLLABUS PLAN - summary of the structure and academic content of the module
Topics (with associated exercises and seminar discussions):
- Taxonomy of problems and approaches in machine learning and statistical modelling
-
Supervised Learning – Classification and Regression
- Decision tree.
- Similarity-based Learning.
- Error based learning.
- Neural Network concepts.
- Ensemble learning concepts.
- Model and classifier evaluation.
-
Unsupervised Learning
- Clustering: hierarchical, partitional and density based.
- Cluster Evaluation.
- Association Rules.
-
Data description and pre-processing
- Dealing with lass and imbalance and resampling.
- Missing values and imputation.
- Noise and Outlier Detection
- Feature Selection
LEARNING AND TEACHING
LEARNING ACTIVITIES AND TEACHING METHODS (given in hours of study time)
| Scheduled Learning & Teaching Activities | 42 | Guided Independent Study | 108 | Placement / Study Abroad | 0 |
|---|
DETAILS OF LEARNING ACTIVITIES AND TEACHING METHODS
| Category | Hours of study time | Description |
| Scheduled learning and teaching activities | 22 | Lectures |
| Scheduled learning and teaching activities | 20 | Workshops/tutorials |
| Guided independent study | 50 | Individual assessed work |
| Guided independent study | 58 | Private study |
ASSESSMENT
FORMATIVE ASSESSMENT - for feedback and development purposes; does not count towards module grade
| Form of Assessment | Size of Assessment (e.g. duration/length) | ILOs Assessed | Feedback Method |
|---|---|---|---|
| Feedback on practical work | 12 hours | All | Oral |
| MCQ mock quiz | 1 hour | 1-4, 6-7 | Online |
SUMMATIVE ASSESSMENT (% of credit)
| Coursework | 30 | Written Exams | 70 | Practical Exams | 0 |
|---|
DETAILS OF SUMMATIVE ASSESSMENT
| Form of Assessment | % of credit | Size of Assessment (e.g. duration/length) | ILOs Assessed | Feedback Method |
|---|---|---|---|---|
| Written exam | 70 | 2 hours | 1-4, 6-7 | Oral on request |
| Coursework/Project | 30 | 4,000 words | All | Written |
DETAILS OF RE-ASSESSMENT (where required by referral or deferral)
| Original Form of Assessment | Form of Re-assessment | ILOs Re-assessed | Time Scale for Re-assessment |
|---|---|---|---|
| Written exam | Written exam (2 hours, 70%) | 1-4, 6-7 | Referral/deferral period |
| Coursework / project | Coursework / project (4,000 words, 30%) | All | Referral/deferral period |
RE-ASSESSMENT NOTES
Reassessment will be by coursework and/or exam (containing multiple choice questions and open-ended questions) in the failed or deferred element only. For referred candidates, the module mark will be capped at 50%. For deferred candidates, the module mark will be uncapped.
RESOURCES
INDICATIVE LEARNING RESOURCES - The following list is offered as an indication of the type & level of
information that you are expected to consult. Further guidance will be provided by the Module Convener
information that you are expected to consult. Further guidance will be provided by the Module Convener
Basic reading:
• Duda and Hart, Pattern Classification and Scene Analysis, 2nd, Wiley, 2002, ISBN 0471056693
• Webb, A., Statistical Pattern Recognition, 2nd, Wiley, 2002, 0-470-84513-9
• Murphy, K., Machine Learning: A Probabilistic Perspective, MIT Press, 2012, ISBN 978-0-262-018029
• John C. Bishop, Pattern recognition and machine learning, Springer, 2006
• Haykin, S., Neural Networks and Learning Machines, 3rd, Pearson, Prentice Hall, ISBN 978-0-13-14713-9
Web-based and electronic resources:
• ELE
Reading list for this module:
| Type | Author | Title | Edition | Publisher | Year | ISBN |
|---|---|---|---|---|---|---|
| Set | Duda and Hart | Pattern Classification and Scene Analysis | 2nd | Wiley | 2002 | 0471056693 |
| Set | Webb, A. | Statistical Pattern Recognition | 2 | Wiley | 2002 | 0-470-84513-9 |
| Set | Murphy, K. | Machine Learning: A Probabilistic Perspective | 1st | MIT Press | 2012 | 978-0-262-018029 |
| Set | Bishop, John C. | Pattern recognition and machine learning | Springer | 2006 | ||
| Set | Haykin, S. | Neural Networks and Learning Machines | 3 | Pearson, Prentice Hall | 978-0-13-14713-9- |
| CREDIT VALUE | 15 | ECTS VALUE | 7.5 |
|---|---|---|---|
| PRE-REQUISITE MODULES | None |
|---|---|
| CO-REQUISITE MODULES | None |
| NQF LEVEL (FHEQ) | 7 | AVAILABLE AS DISTANCE LEARNING | No |
|---|---|---|---|
| ORIGIN DATE | Thursday 14th March 2024 | LAST REVISION DATE | Wednesday 7th May 2025 |
| KEY WORDS SEARCH | Data; machine learning; pattern recognition; probability. |
|---|
Please note that all modules are subject to change, please get in touch if you have any questions about this module.